Footprint-analysis Shows New Solutions of Point-defect Classification and Discrimination

Only state of the art inspection systems reach the high level of defects detection, which is necessary for an efficient cutting and stacking of the glass.

The latest generation of inspection systems using the patented Moiré-Technology is now able to perform a foot-print-analysis of the different defect types with outstanding precision. This enables new possibilities of defect grading and statistical analysis. Manual offline inspection is no longer necessary.

Full-Text Article [23 KB]